作者: Mario M. Pelella , Simon S. Chan , Shankar Sinha
DOI:
关键词: Transistor 、 Electrical engineering 、 MOSFET 、 Silicide 、 Silicon on insulator 、 Materials science
摘要: The present invention relates to a method of forming transistor and structure. comprises the using double silicide process which reduces resistance floating-body-effect when employed in conjunction with SOI type device architecture.