Structuring of DLC:Ag nanocomposite thin films employing plasma chemical etching and ion sputtering

作者: Tomas Tamulevičius , Asta Tamulevičienė , Dainius Virganavičius , Andrius Vasiliauskas , Vitoldas Kopustinskas

DOI: 10.1016/J.NIMB.2013.09.052

关键词: Plasma processingSputteringThin filmPlasma etchingSputter depositionEtching (microfabrication)Reactive-ion etchingAnalytical chemistryIsotropic etchingMaterials science

摘要: … Employing contact lithography and 4 μm period mask in … chemical etching, direct Ar + sputtering or combined etching processes. It … etching in CF 4 /O 2 gas mixture with photoresist mask …

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