作者: Vitor Baranauskas , Bin Bin Li , Marcelo C Tosin , Jing Guo Zhao , Helder J Ceragioli
DOI: 10.1016/S0257-8972(00)00950-6
关键词: Materials science 、 Porous medium 、 Scanning electron microscope 、 Porous silicon 、 Spectroscopy 、 Analytical chemistry 、 Photoluminescence 、 Raman spectroscopy 、 Luminescence 、 Silicon
摘要: Abstract Columnar porous silicon (PS) with deep pores has been prepared by laser-assisted electrochemistry of n- type c-Si wafers immersed in HF/C 2 H 5 OH/H O mixtures different proportions. Analysis the PS micro-Raman spectroscopy was undertaken simultaneously micro-photoluminescence to enable correlation characteristics luminescence spectra probable emission structures. In addition, cross-sectional surfaces samples were studied and compare structures present bulk that top surface. The results suggest strong observed these films originates from PS, not surface Morphological data obtained scanning electron microscopy (SEM) atomic force (AFM) are also discussed.