Properties of Ba-ferrite/AlN double layered films for perpendicular magnetic recording media

作者: Akimitsu Morisako , Toshihide Naka , Kenta Ito , Ayumi Takizawa , Mitsunori Matsumoto

DOI: 10.1016/S0304-8853(01)01230-6

关键词: Composite materialPerpendicularRecording mediaDouble layeredGrain sizeCoercivityNuclear magnetic resonancePerpendicular recordingMaterials scienceThin filmFerrite (magnet)

摘要: Abstract In this paper, research works on Ba-ferrite (BaM) thin films achieved during the last two decades have been introduced. Magnetic properties of BaM/AlN were studied. Grain size BaM layer with an AlN underlayer was suppressed to 50–80 nm. A non-magnetic formed between and layers due diffusion Al. The H C⊥ for c -axis orientation 4.9 kOe at T S about 600°C.

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