作者: Akimitsu Morisako , Toshihide Naka , Kenta Ito , Ayumi Takizawa , Mitsunori Matsumoto
DOI: 10.1016/S0304-8853(01)01230-6
关键词: Composite material 、 Perpendicular 、 Recording media 、 Double layered 、 Grain size 、 Coercivity 、 Nuclear magnetic resonance 、 Perpendicular recording 、 Materials science 、 Thin film 、 Ferrite (magnet)
摘要: Abstract In this paper, research works on Ba-ferrite (BaM) thin films achieved during the last two decades have been introduced. Magnetic properties of BaM/AlN were studied. Grain size BaM layer with an AlN underlayer was suppressed to 50–80 nm. A non-magnetic formed between and layers due diffusion Al. The H C⊥ for c -axis orientation 4.9 kOe at T S about 600°C.