Current status review and future prospects of CBE, MOMBE and GSMBE

作者: W.T. Tsang

DOI: 10.1016/0022-0248(91)90588-V

关键词: DopingNanotechnologyTransistorChemical beam epitaxyHeterojunctionChemistryCompound semiconductorOptoelectronicsMolecular beam epitaxyResidual carbon

摘要: Abstract This paper reviews briefly the recent progress in III–V compound semiconductor epilayer and heterostructure preparations by three different approaches: chemical beam epitaxy (CBE, employing both vapor group III V sources), metalorganic molecular (MOMBE, solid gas source (GSMBE, sources). To data, dominant effort interest is still CBE. The results obtained so far clearly demonstrated that high quality InGaAsP/InP materials heterostructures suitable for state-of-the-art device applications can be routinely prepared With new aluminum compounds becoming available, GaAs/AlGaAs with low residual carbon background also has successfully been recently. modulation doped field-effect transistors CBE have a performance similar to those epitaxy.

参考文章(28)
Norman G. Einspruch, Vlsi Electronics: Microstructure Science ,(1982)
T. Martin, C.R. Whitehouse, Modulated-beam mass spectrometry studies of the MOMBE growth of (100) GaAs and In0.1Ga0.9As Journal of Crystal Growth. ,vol. 105, pp. 57- 68 ,(1990) , 10.1016/0022-0248(90)90339-M
Hiroyuki Hirayama, Masayuki Hiroi, Kazuhisa Koyama, Toru Tatsumi, Gas source Si-MBE Journal of Crystal Growth. ,vol. 105, pp. 46- 51 ,(1990) , 10.1016/0022-0248(90)90337-K
Y. Iimura, K. Nagata, Y. Aoyagi, S. Namba, Surface segregation of indium during growth of InGaAs in chemical beam epitaxy Journal of Crystal Growth. ,vol. 105, pp. 230- 233 ,(1990) , 10.1016/0022-0248(90)90367-T
L. Goldstein, Optoelectronic devices by GSMBE Journal of Crystal Growth. ,vol. 105, pp. 93- 96 ,(1990) , 10.1016/0022-0248(90)90344-K
Atsutoshi Doi, Yoshinobu Aoyagi, Susumu Namba, Growth of GaAs by switched laser metalorganic vapor phase epitaxy Applied Physics Letters. ,vol. 48, pp. 1787- 1789 ,(1986) , 10.1063/1.96787
T. H. Chiu, W. T. Tsang, J. A. Ditzenberger, C. W. Tu, F. Ren, C. S. Wu, Growth of device quality GaAs by chemical beam epitaxy Journal of Electronic Materials. ,vol. 17, pp. 217- 221 ,(1988) , 10.1007/BF02652181
M. Weyers, J. Musolf, D. Marx, A. Kohl, P. Balk, Gaseous dopant sources in MOMBE/CBE Journal of Crystal Growth. ,vol. 105, pp. 383- 392 ,(1990) , 10.1016/0022-0248(90)90390-7
T.H. Chiu, J.E. Cunningham, A. Robertson, D.L. Malm, Atomic layer epitaxy of GaAs by chemical beam epitaxy Journal of Crystal Growth. ,vol. 105, pp. 155- 161 ,(1990) , 10.1016/0022-0248(90)90354-N
H. Temkin, K. Berthold, A. F. J. Levi, S. N. G. Chu, T. Tanbun‐Ek, R. A. Logan, Very low threshold InGaAs/InGaAsP graded index separate confinement heterostructure quantum well lasers grown by atmospheric pressure metalorganic vapor phase epitaxy Applied Physics Letters. ,vol. 55, pp. 2283- 2285 ,(1989) , 10.1063/1.102038