作者: G.J. Davies , P.J. Skevington , C.L. French , J.S. Foord
DOI: 10.1016/0022-0248(92)90420-N
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摘要: Abstract The reactions of triethylgallium (TEG) on a silicon nitride surface have been investigated to determine the underlying causes for selective area epitaxy. Using techniques X-ray photo electron spectroscopy and temperature programmed desorption, TEG is found weakly adsorb defect sites at room temperature. Desorption favoured over further decomposition higher substrate temperatures. results are compared with interaction GaAs(100) implications influence arsenic growth discussed.