作者: R. Matz , H. Heinecke , B. Baur , R. Primig , C. Cremer
DOI: 10.1016/0022-0248(93)90611-Y
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摘要: Abstract InP facet growth near SiO 2 mask edges during metalorganic molecular beam epitaxy is studied for various V/III ratios on (100) substrates with 2° misorientation towards (110). While ideal vertical layer occurs at high ratio even up to μm thickness, oblique (111) planes are kinetically favoured lower ratio. The a key parameter since it determines the facets lowest limited rate border of growing layer. Also diffusion length mobile adsorbed species, by which additional features and corners explained, decreases Besides interfacet driven concentration gradients between different rate, there evidence also anisotropic along [0–1] InP. We speculate that this origin fine surface ripples surfaces observed one side masks.