Base current tuning in SiGe HBT's by SiGe in the emitter

作者: H.G.A. Huizing , J.H. Klootwijk , E. Aksen , J.W. Slotboom

DOI: 10.1109/IEDM.2001.979658

关键词: Heterojunction bipolar transistorBipolar junction transistorCommon emitterVoltageBreakdown voltageHeterojunctionMaterials scienceOptoelectronicsHeterostructure-emitter bipolar transistorCurrent injection technique

摘要: Npn-type SiGe heterojunction bipolar transistors (HBT's) have high cut-off frequencies, but low breakdown voltages due to their current gain. We show that a layer in the emitter can increase base and hence voltage while collector frequency are not reduced. Simulations first experimental results clearly confirm this effect.

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