作者: S.K. Sundaram , C.H. Henager , D.J. Edwards , A.L. Schemer-Kohrn , M. Bliss
DOI: 10.1016/J.NIMA.2010.09.128
关键词: Physics 、 Diffraction 、 Infrared microscopy 、 Electron backscatter diffraction 、 Optics 、 Dislocation 、 Microscopy 、 Misorientation 、 Characterization (materials science) 、 Particle detector
摘要: Advanced characterization tools, such as electron backscatter diffraction and transmitted IR microscopy, are being applied to study critical microstructural features orientation relations in as-grown CZT crystals aid understanding the relation between structure properties radiation detectors. Even carefully prepared single of contain regions slight misorientation, Te-particles, dislocation networks that must be understood for more accurate models detector response. This paper describes initial research at PNNL into hierarchy microstructures observed grown via vertical gradient freeze or Bridgman method WSU.