Electron backscatter diffraction of a Ge growth tip from a vertical gradient freeze furnace

摘要: Abstract The growth-tip region of a high-purity 4.2-cm-diameter Ge boule grown using low-pressure Bridgman methods in vertical gradient freeze furnace was sectioned and polished preparation for scanning electron microscopy characterized backscatter diffraction (EBSD). had characteristic conical tip with cone angle 40° right circular cylinder from which section taken along the longitudinal centerline an approximate surface area 4 cm 2 . majority this EBSD image collage assembled region. grain structure, boundary orientation, twin overall crystal growth direction were determined. A approximately 〈1 1 2〉 observed, also identified as several prominent twins observed structure appeared to be controlled by sidewall nucleation stray that competed dominance during growth. Grain boundaries triple junctions low-energy coincident-site-lattice (CSL) Σ3 Σ9 types.