Electron backscatter diffraction analysis of a CZT growth tip from a vertical gradient freeze furnace

摘要: Abstract Electron backscatter diffraction (EBSD) was used to characterize the growth-tip region of a 4.2-cm diameter CdZnTe (CZT) boule grown using low-pressure Bridgman method in vertical gradient freeze furnace. The sectioned and polished section taken along longitudinal centerline with an approximate surface area 1-cm2 for optical scanning electron microscopy. A collage assembled EBSD/SEM images show morphological features, e.g., twin structure, grain overall crystal growth direction. Severely twinned regions originating from tip side walls were observed. orientation close 〈1 1 0〉 〈1 1 2〉 directions. In some regions, (0 0 1) poles CZT matrix aligned direction, while twins such that (1 1 1) (1 1 2) other areas, or (0 1 1) New relationships between large Te polycrystalline particles revealed: {1 1 2}CZT∣∣{1 1 0 0}Te {0 0 1}CZT∣∣{0 1 1 1}Te.