X-ray diffraction studies of thin films and multilayer structures
作者： Armin Segmüller , I.C. Noyan , V.S. Speriosu
DOI: 10.1016/0146-3535(89)90024-5
关键词: Thin film 、 Diffraction 、 Acousto-optics 、 Superlattice 、 Infinitesimal strain theory 、 Condensed matter physics 、 X-ray crystallography 、 Reflection (mathematics) 、 Characterization (materials science) 、 Optics 、 Materials science
摘要: … in thin films in several directions. Also discussed will be methods to determine stresses in thin films by … and strain modulations, in thin films, multilayers and superlattices, by the powerful …
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sci-hub.se 参考文章(72)
L. G. Schulz, A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer Journal of Applied Physics. ,vol. 20, pp. 1030- 1033 ,(1949) , 10.1063/1.1698268
T. Mura, D. M. Barnett, Micromechanics of defects in solids ,(1982)
T. Siegrist, Armin Segmüller, H. Mariette, F. Holtzberg, Growth of epitaxial films of CdTe and (Cd,Mn)Te on GaAs substrates Applied Physics Letters. ,vol. 48, pp. 1395- 1397 ,(1986) , 10.1063/1.96920
E. Kröner, Bounds for effective elastic moduli of disordered materials Journal of the Mechanics and Physics of Solids. ,vol. 25, pp. 137- 155 ,(1977) , 10.1016/0022-5096(77)90009-6
I. C. Noyan, L. T. Nguyen, Residual stresses in polymeric passivation and encapsulation materials Polymer Engineering and Science. ,vol. 28, pp. 1026- 1033 ,(1988) , 10.1002/PEN.760281603
L. Tapfer, K. Ploog, Improved assessment of structural properties of Al x Ga 1 − x As/GaAs heterostructures and superlattices by double-crystal x-ray diffraction Physical Review B. ,vol. 33, pp. 5565- 5574 ,(1986) , 10.1103/PHYSREVB.33.5565
J. H. Souk, Armin Segmüller, J. Angilello, Oriented growth of ultrathin tungsten films on sapphire substrates Journal of Applied Physics. ,vol. 62, pp. 509- 512 ,(1987) , 10.1063/1.339775
V. S. Speriosu, M.‐A. Nicolet, S. T. Picraux, R. M. Biefeld, Depth profiles of perpendicular and parallel strain in a GaAsxP1−x/GaP superlattice Applied Physics Letters. ,vol. 45, pp. 223- 225 ,(1984) , 10.1063/1.95190
R. Zeyfang, Stresses in Epitaxially Grown Single‐Crystal Films: YIG on YAG Journal of Applied Physics. ,vol. 41, pp. 3718- 3721 ,(1970) , 10.1063/1.1659497
M. J. Hill, B. K. Tanner, M. A. G. Halliwell, M. H. Lyons, Simulation of X-ray double-crystal rocking curves at multiple and inhomogeneous heteroepitaxial layers Journal of Applied Crystallography. ,vol. 18, pp. 446- 451 ,(1985) , 10.1107/S002188988501069X