作者: D. Briand , N. F. de Rooij , A. Odaymat , L. Thiery
DOI:
关键词: Microsystem 、 Temperature measurement 、 Cantilever 、 Semiconductor 、 Thermal analysis 、 Thermal 、 Mechanical engineering 、 Scanning capacitance microscopy 、 Finite element method 、 Materials science
摘要: Micro-hotplates are thermal components commonly applied in microsystems such as micromachined semiconductor gas sensors based on metal oxides [1]. Their operating principle is a precise and fast heating up at low power of small thermally isolated area temperatures to 500°C. An accurate knowledge thermo-physical parameters coupled real-operation control procedure required ensure their proper operation future development. However, micro-thermal experiments suffering from lack available techniques. In this paper, we report the extension use micro-thermocouple cantilevered probe perform direct measurements temperature distribution micro-hotplate membranes for extracting adequate quantities input-values finite elements methods (FEM) simulations.