作者: J. Li , T. N. Oder , M. L. Nakarmi , J. Y. Lin , H. X. Jiang
DOI: 10.1063/1.1450038
关键词: Materials science 、 Metalorganic vapour phase epitaxy 、 Analytical chemistry 、 Chemical vapor deposition 、 Photoluminescence 、 Doping 、 Activation energy 、 Acceptor 、 Hall effect 、 Electrical resistivity and conductivity
摘要: Mg-doped AlxGa1−xN epilayers with Al content up to 0.27 were grown on sapphire substrates by metalorganic chemical vapor deposition (MOCVD). p-type conduction in these alloys has been achieved, as confirmed variable temperature Hall-effect measurements. Emission lines of band-to-impurity transitions free electrons neutral Mg acceptors well localized excitons have observed the alloys. The acceptor activation energies EA deduced from photoluminescence spectra and found increase agreed very those obtained Hall From measured energy a function content, versus x resistivity high contents can be deduced. Our results thus indicated that alternative methods for AlGaN must developed. also shown PL measurements provide direct means obtaining EA, especially where this canno...