作者: R B Roberts
DOI: 10.1088/0022-3727/14/10/003
关键词: Interferometry 、 Polarization (waves) 、 Polycrystalline silicon 、 Optoelectronics 、 Materials science 、 Silicon 、 Thermal expansion 、 Resistance thermometer
摘要: Measurements of the coefficient linear thermal expansion pure polycrystalline silicon were made with a polarization interferometer and platinum resistance thermometer an estimated error less than 0.01 × 10-6 K-1.