Hole mobility in p-type HgTe

作者: Z. Dziuba , K. Szlenk

DOI: 10.1016/0022-3697(84)90106-9

关键词: Charge carrierDensity of statesElectrical resistivity and conductivityCondensed matter physicsImpurityHall effectInorganic compoundAnalytical chemistryElectron mobilityAcceptorChemistry

摘要: Abstract Experimental data concerning the electrical conduction and Hall coefficient in HgTe samples with acceptor states have been collected analysed. In analysis three ranges of concentration distinguished: a low range up to about 5 × 10 15 cm −3 (pure samples), high from 16 18 ( p -like an extremely above -type samples). pure holes are valence band, “holes” impurity strong mixing impurity-valence band. The mobility band is order 2 Vs . decreases increasing 3 125 independent equal

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