Surface scanning probe microscopy investigation of solution deposited BiFeO3 thin films
作者： S. Habouti , C. Solterbeck , M. Es-Souni
DOI: 10.1063/1.2212280
关键词: Microstructure 、 Oxide 、 Crystallography 、 Composite material 、 Materials science 、 Carbon film 、 Annealing (metallurgy) 、 Thin film 、 Scanning probe microscopy 、 Microscopy 、 Dielectric 、 Physics and Astronomy (miscellaneous)
摘要: Thin films of the multiferroic perovskite-type oxide BiFeO3 were processed via solution deposition. The annealing schedule was chosen so as to give large and fine grained thin films. Microstructure, polarization, dielectric properties are reported. It is shown that film characterized by poor properties. Both microstructures show, however, polarization characteristics. Surface scanning potential microscopy reveals areas high low surface potentials in both specimens with a pronounced effect thought these indirectly responsible for
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Yi-Hsien Lee, Jenn-Ming Wu, Yu-Lun Chueh, Li-Jen Chou, Low-temperature growth and interface characterization of BiFeO3 thin films with reduced leakage current Applied Physics Letters. ,vol. 87, pp. 172901- ,(2005) , 10.1063/1.2112181
Xiaoding Qi, Joonghoe Dho, Rumen Tomov, Mark G. Blamire, Judith L. MacManus-Driscoll, Greatly reduced leakage current and conduction mechanism in aliovalent-ion-doped BiFeO3 Applied Physics Letters. ,vol. 86, pp. 062903- ,(2005) , 10.1063/1.1862336
F. Tyholdt, S. Jørgensen, H. Fjellvåg, A.E. Gunnæs, Synthesis of Oriented BiFeO3 Thin Films by Chemical Solution Deposition: Phase, Texture, and Microstructural Development Journal of Materials Research. ,vol. 20, pp. 2127- 2139 ,(2005) , 10.1557/JMR.2005.0263
SY Yang, F Zavaliche, L Mohaddes-Ardabili, V Vaithyanathan, DG Schlom, YJ Lee, YH Chu, MP Cruz, Q Zhan, T Zhao, and R Ramesh, None, Metalorganic chemical vapor deposition of lead-free ferroelectric BiFeO3 films for memory applications Applied Physics Letters. ,vol. 87, pp. 102903- ,(2005) , 10.1063/1.2041830
S. Iakovlev, C.-H. Solterbeck, M. Kuhnke, M. Es-Souni, Multiferroic BiFeO3 thin films processed via chemical solution deposition: Structural and electrical characterization Journal of Applied Physics. ,vol. 97, pp. 094901- ,(2005) , 10.1063/1.1881776
Keith G. Brooks, Radosveta D. Klissurska, Pedro Moeckli, N. Setter, Influence of texture on the switching behavior of Pb(Zr 0.70 Ti 0.30 )O 3 sol-gel derived thin films Journal of Materials Research. ,vol. 12, pp. 531- 540 ,(1997) , 10.1557/JMR.1997.0076
S. Yakovlev, J. Zekonyte, C.-H. Solterbeck, M. Es-Souni, Interfacial effects on the electrical properties of multiferroic BiFeO3/Pt/Si thin film heterostructures Thin Solid Films. ,vol. 493, pp. 24- 29 ,(2005) , 10.1016/J.TSF.2005.06.020
R. Ramesh J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, None, Epitaxial BiFeO3 Multiferroic Thin Film Heterostructures Science. ,vol. 299, pp. 1719- 1722 ,(2003) , 10.1126/SCIENCE.1080615
F. Kubel, H. Schmid, Structure of a ferroelectric and ferroelastic monodomain crystal of the perovskite BiFeO3 Acta Crystallographica Section B Structural Science. ,vol. 46, pp. 698- 702 ,(1990) , 10.1107/S0108768190006887