Stress of needle specimen on the three‐dimensional atom probe (3DAP)

作者: N. Mayama , C. Yamashita , T. Kaito , M. Nojima , M. Owari

DOI: 10.1002/SIA.2905

关键词:

摘要: The three-dimensional atom probe (3DAP) is one of the ways to image materials three-dimensionally on atomic scale. However, some technical issues in 3DAP are still unresolved. One them rupture a specimen that sometimes occurs when atoms field-evaporated at apex needle specimen. This caused by high electric stress around tip way reduce enlarge taper angle In this study, adapting idea 3DAP, we estimated appropriate values not only but also its diameter, length, radius curvature, and distance between local electrode simulation. Furthermore, calculated average value field-induced each plane for z-direction Copyright © 2008 John Wiley & Sons, Ltd.

参考文章(6)
Osamu Nishikawa, Yoshikatsu Ohtani, Kiyoshi Maeda, Masafumi Watanabe, Keiji Tanaka, Development of the Scanning Atom Probe and Atomic Level Analysis Materials Characterization. ,vol. 44, pp. 29- 57 ,(2000) , 10.1016/S1044-5803(99)00046-7
M.A. Fortes, The shape of field-evaporated metal tips Surface Science. ,vol. 28, pp. 95- 116 ,(1971) , 10.1016/0039-6028(71)90088-4
H.C. Eaton, R.J. Bayuzick, Field-induced stresses in field emitters Surface Science. ,vol. 70, pp. 408- 426 ,(1978) , 10.1016/0039-6028(78)90423-5
Zhen-Bang Kuang, The stress field near the blunt crack tip and the fracture criterion Engineering Fracture Mechanics. ,vol. 16, pp. 19- 33 ,(1982) , 10.1016/0013-7944(82)90032-7
Osamu Nishikawa, Masahiro Kimoto, Toward a scanning atom probe — computer simulation of electric field - Applied Surface Science. ,vol. 76, pp. 424- 430 ,(1994) , 10.1016/0169-4332(94)90376-X
Penny J. Birdseye, D.A. Smith, The electric field and the stress on a field-ion specimen Surface Science. ,vol. 23, pp. 198- 210 ,(1970) , 10.1016/0039-6028(70)90013-0