A New Method for Quantitative XEDS Tomography of Complex Heteronanostructures
作者： Daniele Zanaga , Thomas Altantzis , Lakshminarayana Polavarapu , Luis M. Liz-Marzán , Bert Freitag
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摘要: Reliable quantification of 3D results obtained by X-ray energy-dispersive spectroscopy (XEDS) tomography is currently hampered the presence shadowing effects and poor spatial resolution. Here, a method presented which overcomes these problems synergistically combining quantified XEDS data high angle annular dark field–scanning transmission electron microscopy tomography. As proof principle, approach applied to characterize complex Au/Ag nanorattle through galvanic replacement reaction. However, technique that proposed here widely applicable broad range nanostructures.
sci-hub.se 参考文章(33)
Wim van Aarle, Willem Jan Palenstijn, Jan De Beenhouwer, Thomas Altantzis, Sara Bals, K. Joost Batenburg, Jan Sijbers, The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography Ultramicroscopy. ,vol. 157, pp. 35- 47 ,(2015) , 10.1016/J.ULTRAMIC.2015.05.002
Folkert Bleichrodt, Tristan van Leeuwen, Willem Jan Palenstijn, Wim van Aarle, Jan Sijbers, K. Joost Batenburg, Easy implementation of advanced tomography algorithms using the ASTRA toolbox with Spot operators Numerical Algorithms. ,vol. 71, pp. 673- 697 ,(2016) , 10.1007/S11075-015-0016-4
Lakshminarayana Polavarapu, Luis M. Liz-Marzán, Growth and galvanic replacement of silver nanocubes in organic media Nanoscale. ,vol. 5, pp. 4355- 4361 ,(2013) , 10.1039/C3NR01244A
P. Schlossmacher, D.O. Klenov, B. Freitag, H.S. von Harrach, Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology Microscopy Today. ,vol. 18, pp. 14- 20 ,(2010) , 10.1017/S1551929510000404
Arda Genc, Libor Kovarik, Meng Gu, Huikai Cheng, Paul Plachinda, Lee Pullan, Bert Freitag, Chongmin Wang, XEDS STEM tomography for 3D chemical characterization of nanoscale particles. Ultramicroscopy. ,vol. 131, pp. 24- 32 ,(2013) , 10.1016/J.ULTRAMIC.2013.03.023
P.A. Midgley, M. Weyland, 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography Ultramicroscopy. ,vol. 96, pp. 413- 431 ,(2003) , 10.1016/S0304-3991(03)00105-0
K. Lepinay, F. Lorut, R. Pantel, T. Epicier, Chemical 3D tomography of 28nm high K metal gate transistor: STEM XEDS experimental method and results. Micron. ,vol. 47, pp. 43- 49 ,(2013) , 10.1016/J.MICRON.2013.01.004
I Arslan, TJV Yates, ND Browning, PA Midgley, Embedded nanostructures revealed in three dimensions. Science. ,vol. 309, pp. 2195- 2198 ,(2005) , 10.1126/SCIENCE.1116745
Thomas J. A. Slater, Alexandra Macedo, Sven L. M. Schroeder, M. Grace Burke, Paul O’Brien, Pedro H. C. Camargo, Sarah J. Haigh, Correlating Catalytic Activity of Ag–Au Nanoparticles with 3D Compositional Variations Nano Letters. ,vol. 14, pp. 1921- 1926 ,(2014) , 10.1021/NL4047448
Jingyi Chen, Benjamin Wiley, Joseph McLellan, Yujie Xiong, Zhi-Yuan Li, Younan Xia, Optical properties of Pd-Ag and Pt-Ag nanoboxes synthesized via galvanic replacement reactions. Nano Letters. ,vol. 5, pp. 2058- 2062 ,(2005) , 10.1021/NL051652U