作者: Jong Min Yuk , Jeong Yong Lee , Young-Soo No , Tae Whan Kim , Won Kook Choi
DOI: 10.1063/1.2957467
关键词:
摘要: Transmission electron microscopy (TEM), high-resolution TEM, and atomic force images showed that the columnar structure surface morphology of grains in ZnO thin films grown on p-InP substrates were changed due to thermal treatment. The variation was attributed curvature modification subpopulations consisting grains. While top became parallel with {0001} planes treatment, rough. Evolution mechanisms are described.