作者: F. Felder , A. Fognini , M. Rahim , M. Fill , E. Müller
DOI: 10.1016/J.PHPRO.2010.01.149
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摘要: Abstract We describe the growth and formation of self assembled PbTe quantum dots in a CdTe host on silicon (111) substrate. Annealing yields different photoluminescence spectra depending initial layer thickness, thickness cap annealing temperature. Generally two distinct emission peaks at ∼0.3 eV ∼0.45 eV are visible. Model calculations explaining their temperature dependence performed. The dot size corresponds well with estimated sizes from electron microscopy images. may be used as absorber within mid-infrared detector.