Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragments
作者： U. Boesl , R. Weinkauf , E.W. Schlag
DOI: 10.1016/0168-1176(92)80001-H
关键词:
摘要: … secondary mass spectra of benzene and its fragment ions after … Laser reflectron mass spectrometry with postacceleration, … even secondary mass spectra of this weak fragment ion. A first …
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