作者: Jungho Ryu , Jong-Jin Choi , Byung-Dong Hahn , Dong-Soo Park , Woon-Ha Yoon
DOI: 10.1063/1.2828892
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摘要: Lead-free, piezoelectric thick films of 0.948(K0.5Na0.5)NbO3–0.052LiSbO3 were fabricated by aerosol deposition and the effect postannealing temperature on dielectric, ferroelectric, properties was investigated. The thickness ranged from 5to17μm highly dense obtained after at room temperature. With increasing annealing temperature, dielectric ferroelectric markedly increased. maximum e3T∕e0=1012, Pr=15.5μC∕cm2, d33=50pm∕V 800°C for 1h. Above this film exhibited rapid property degradation as it decomposed due to Na2O evaporation.