Dielectric Relaxation of MIM Capacitor and Its Effect on Sigma-Delta A/D Converters
作者： Zhenqiu Ning , Herman Casier , Jeroen De Maeyer , Erik Heirman , Erwin De Vylder
关键词:
摘要: Dielectric relaxation of capacitors is one the error sources when determining accuracy analog sampled-data systems that are based on charge storage. To perform an accurate characterization dielectric metal-insulator-metal (MIM) capacitor, techniques voltage recovery principle and Curie Von Schweidler discharge current approach developed. model MIM Dow's selected. An algorithm for parameter extraction has been developed, which shows phenomenon in detail very fast to determine parameters. Based measurement data, a set parameters extracted verified, approximates law over sufficiently wide interval time constants. study effect circuit performance high resolution sigma-delta ADC, 12-b incremental ADC selected as example simulation. The simulation results show not significant. We .major reason this noise shaping enforced by integrators SigmaDelta-ADC almost affected phenomenon.
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