作者: Antonio Faba , Stefano Gaiotto , Gabriele Maria Lozito
DOI: 10.1016/J.SOLENER.2017.10.015
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摘要: Abstract A novel methodology to assess the degradation of a photovoltaic module is presented. The can be represented by progressive alteration equivalent One-Diode circuit model for device. involved elements are series and shunt resistances. It possible estimate alterations these measuring divergence between device behaviour. Two novelties key aspects this work. First, identified through very accurate procedure. Second, irradiance estimated directly means device, without need additional sensors. result completely on-line estimation that does not require any change in operating point.