作者: Mahesh Kumar , Thirumaleshwara N. Bhat , Mohana K. Rajpalke , Basanta Roul , Neeraj Sinha
DOI: 10.1016/J.SSC.2010.12.023
关键词:
摘要: Abstract Negative differential capacitance (NDC) has been observed in n-GaN/p-Si heterojunctions grown by plasma assisted molecular beam epitaxy (PAMBE). The NDC is at low frequencies 1 and 10 kilohertz (kHz) disappeared a higher testing frequency of 100 kHz. also studied with temperature found that it above 323 ∘C. Current–Voltage ( I – V ) characteristics n-GaN /p-Si heterojunction were measured different temperatures are attributed to the space-charge-limited current (SCLC). A simple model involving two quantum states proposed explain behavior.