Nanoscale imaging of domain dynamics and retention in ferroelectric thin films
作者： A. Gruverman , H. Tokumoto , A. S. Prakash , S. Aggarwal , B. Yang
DOI: 10.1063/1.120369
关键词:
摘要: We report results on the direct observation of microscopic origins backswitching in ferroelectric thin films. The piezoelectric response generated film by a biased atomic force microscope tip was used to obtain static and dynamic images individual grains polycrystalline material. demonstrate that polarization reversal occurs under no external field (i.e., loss remanent polarization) via dispersive continuous-time random walk process, identified stretched exponential decay polarization.
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sci-hub.se 参考文章(9)
CP De Araujo, JF Scott, GW Taylor, None, Ferroelectric thin films : synthesis and basic properties Gordon & Breach. ,(1996)
R. Lüthi, H. Haefke, K.‐P. Meyer, E. Meyer, L. Howald, H.‐J. Güntherodt, Surface and domain structures of ferroelectric crystals studied with scanning force microscopy Journal of Applied Physics. ,vol. 74, pp. 7461- 7471 ,(1993) , 10.1063/1.354969
Harvey Scher, Elliott W. Montroll, Anomalous transit-time dispersion in amorphous solids Physical Review B. ,vol. 12, pp. 2455- 2477 ,(1975) , 10.1103/PHYSREVB.12.2455
J. Kakalios, R. A. Street, W. B. Jackson, Stretched-exponential relaxation arising from dispersive diffusion of hydrogen in amorphous silicon. Physical Review Letters. ,vol. 59, pp. 1037- 1040 ,(1987) , 10.1103/PHYSREVLETT.59.1037
K. Franke, J. Besold, W. Haessler, C. Seegebarth, Modification and detection of domains on ferroelectric PZT films by scanning force microscopy Surface Science. ,vol. 302, ,(1994) , 10.1016/0039-6028(94)91089-8
K. Husimi, K. Kataoka, Ultrasonic Measurement of Polarization Switching Processes in Barium‐Titanate Single Crystal Journal of Applied Physics. ,vol. 29, pp. 1247- 1251 ,(1958) , 10.1063/1.1723413
R. V. Chamberlin, George Mozurkewich, R. Orbach, Time Decay of the Remanent Magnetization in Spin-Glasses Physical Review Letters. ,vol. 52, pp. 867- 870 ,(1984) , 10.1103/PHYSREVLETT.52.867
A. Gruverman, O. Auciello, H. Tokumoto, Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films Applied Physics Letters. ,vol. 69, pp. 3191- 3193 ,(1996) , 10.1063/1.117957
Genaro Zavala, Janos H. Fendler, Susan Trolier-McKinstry, Characterization of ferroelectric lead zirconate titanate films by scanning force microscopy Journal of Applied Physics. ,vol. 81, pp. 7480- 7491 ,(1997) , 10.1063/1.365350