Using epitaxially grown wells for reducing junction capacitances

作者: Sunit Tyagi

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摘要: The present invention is a semiconductor device having and method for forming wells by growing an epitaxial silicon layer wherein the has at least three sublayers. first sublayer highly doped, second less third also doped. use of epitaxially grown allows placement high dopant concentrations in regions well where electrical isolation issue lower doped not as great order to help reduce problem parasitic capacitance.

参考文章(6)
Bruce A. Beitman, Charles F. Boucher, Trench gate VCMOS ,(1988)
Bantval Jayant Baliga, Silicon carbide field effect device ,(1993)
Nobuyoshi Natsuaki, Masao Tamura, Kiyonori Ohyu, Shoji Syukuri, Hidekazu Okuhira, Akira Shintani, Yasuo Wada, Tadashi Suzuki, Method of forming twin doped regions of the same depth by high energy implant ,(1986)