Use of the Schiller decapitation process for the manufacture of high quality tungsten scanning tunneling microscopy tips
作者： G. J. de Raad , P. M. Koenraad , J. H. Wolter
DOI: 10.1116/1.590854
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摘要: When tungsten scanning tunneling microscopy (STM) tips are sharpened by self-sputtering with Ne + ions, the Schiller-decapitation process can occur. We show that this process is …
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