Subsurface imaging of two-dimensional materials at the nanoscale.

摘要: Scanning probe microscopy (SPM) represents a powerful tool that, in the past 30 years, has allowed for investigation of material surfaces unprecedented ways at nanoscale level. However, SPM shown very little capability depth penetration, which several nanotechnology applications require. Subsurface imaging been achieved only few cases, when subsurface features influence physical properties surface, such as electronic states or heat transfer. Ultrasonic force (UFM), an adaption contact mode atomic microscopy, can dynamically measure stiffness elastic between probing tip and sample surface. In particular, UFM proven highly sensitive to near-surface field non-homogeneous samples. this paper, we present two-dimensional (2D) materials, namely flakes graphite molybdenum disulphide placed on structured polymeric substrates. We show that non-destructively distinguish suspended supported areas localise defects, buckling delamination adjacent monolayers, generated by residual stress. Specifically, small variations local indentation induced mechanical interaction sample. Therefore, any change modulus within volume perturbed applied load flexural bending be detected imaged. These capabilities are promising order study buried interfaces nanostructured 2D materials graphene-based devices.