作者: Slavomír Nemšák , Evgheni Strelcov , Tomáš Duchoň , Hongxuan Guo , Johanna Hackl
DOI: 10.1021/JACS.7B07365
关键词:
摘要: … Until recently, use of photoemission electron microscopy (PEEM) for such purposes has … of the electron optics and detector. Here we demonstrate that the use of ultrathin electron …