Instrument for research on interfaces and surfaces
作者： C. Bonnelle , F. Vergand , P. Jonnard , J.‐M. André , P. F. Staub
DOI: 10.1063/1.1144524
关键词:
摘要: We describe an instrument designed for studying the electronic structure of bulk, surface, and deep solid–solid interface. The analysis is made by soft‐x‐ray emission spectroscopy induced electron bombardment. target placed under ultrahigh vacuum can be prepared treated in situ. High resolution achieved both as concerns photon energy electron‐beam energy. Tests have been dispersive mode characteristic isochromat mode. In cases experimental good agreement with expected one.
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sci-hub.se 参考文章(18)
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