作者: K. Lomakin , R. Guschlbauer , F. Osmanlic , Z. Fu , M. Sippel
DOI: 10.23919/EUMC.2019.8910893
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摘要: This work evaluates 3D printed E-Band waveguides by selective electron beam melting process with two different scanning pattern approaches. One is the contouring and other hatching which are used to draw waveguide cross section layer wise. The measured signal attenuation can be significantly reduced only about $\alpha$ ≈ 11–17 dB/m in applying contour strategy despite relatively large macroscopic RMS surface roughness of Rq ≳ 30 µm. Furthermore, a model based explanation for results proposed suggesting distinct separation between microscopic structure geometry frequencies beyond.