Formation of bubbles on electrical contacts to polymer light-emitting diode devices

作者: Shyh-Chyang Luo , Hsiu-Hsin Chung , Eugene T. Pashuck , Elliot P. Douglas , Paul H. Holloway

DOI: 10.1016/J.TSF.2004.10.039

关键词:

摘要: Bubble formation on calcium/aluminum contacts to bilayer poly(n-vinyl carbazole) (PVK)/poly(3,4-ethylenedioxythiophene)-poly(4-styrenesulfonate) (PEDOT-PSS) polymer light-emitting diode (PLED) devices was studied using optical and electron microscopies Auger spectroscopy (AES). The of bubbles is shown correlate with pinholes in the metal contact thin film excess absorbed water presence calcium layer. AES data show oxidation at Ca/Al interface during this process. Gas evolution relaxation compressive stress when voltage applied PLED are postulated cause bubbles.

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