Plasma processing apparatus and component thereof including an optical fiber for determining a temperature thereof

作者: Harmeet Singh

DOI:

关键词:

摘要: A plasma processing apparatus for semiconductor substrates comprises a chamber in which substrate is processed. process gas source fluid communication with the and adapted to supply into chamber. RF energy energize state Process byproducts of are exhausted from through vacuum port. At least one component laterally extending optical fiber beneath exposed surface wherein spatial temperature measurements desired be taken, monitoring arrangement coupled so as monitor temperatures at different locations along fiber.

参考文章(64)
Sien Chi, Hong-Yih Tseng, Peng-Chun Peng, Fiber bragg grating sensor system ,(2002)
Cristian Dan, Ruud Antonius Catharina Maria Beerens, Johannes Hendrikus Maria Spruit, Richard Henricus Adrianus Van Lieshout, Lithographic apparatus with a deformation sensor. ,(2012)
Ralph Jan-Pin Lu, Paul Robertson, Tom Anderson, Eric A. Pape, Neil Benjamin, Keith William Gaff, Keith Comendant, Power switching system for esc with array of thermal control elements ,(2012)
Ehsan Toyserkani, Hamidreza Alemohammad, Optical fibre sensor and methods of manufacture ,(2010)
Tomohito Komatsu, Hiroo Kawasaki, Sumi Tanaka, Loading table structure and processing device ,(2009)
Michael Wiggenhorn, Wolfgang Friess, Manfred Resch, Dryer with monitoring device ,(2009)
Anthony Ricci, Keith Comendant, Keith William Gaff, Thermal plate with planar thermal zones for semiconductor processing ,(2011)