Tem Study of Yielding in Polycrystalline Gold Thin Films

摘要: We have used transmission electron microscopy (TEM) to study the microstructure of thin gold films which were grown on 〈100〉 rock salt. The samples annealed salt substrate or a TEM specimen grid. Films had larger mean grain size than those grids. All 〈111〉 preferred orientation. Several cracks are observed in film Plastic yielding was identified by presence dislocations, and is caused tensile stress derived from growth. In spite uniform texture films, dislocations concentrated only some individual grains, while their surrounding grains remained dislocation-free. Yielded showed no difference orientation that would lead higher Schmid factors, so other predictors must be considered.