Effect of orientation on the dielectric and piezoelectric properties of 0.2Pb(Mg1/3Nb2/3)O3–0.8Pb(Zr0.5Ti0.5)O3 thin films
作者： Ki Hyun Yoon , Byoung Duk Lee , Jihoon Park
DOI: 10.1063/1.1394947
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摘要: 0.2Pb(Mg1/3Nb2/3)O3–0.8Pb(Zr0.5Ti0.5)O3 (0.2PMN–0.8PZT) thin films were deposited on Pt(111)/Ti/SiO2/Si [Pt(111)] and Pt(200)/SiO2/Si [Pt(200)] substrates by a sol–gel method, the effect of orientation piezoelectric dielectric properties 0.2PMN–0.8PZT was investigated. The Pt(111) Pt(200) showed strong (111) (100) preferred orientations, respectively. spontaneous polarization oriented film higher than that film. However, constant (K) transverse coefficients (d31) Because direction is more tilted away from normal to surface film, coefficient enhanced.
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