作者: H. Arizpe-Chávez , R. Ramı́rez-Bon , F.J. Espinoza-Beltrán , O. Zelaya-Angel , J.L. Marı́n
DOI: 10.1016/S0022-3697(99)00258-9
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摘要: Abstract Two kinds of CdTe nanostructured films were prepared by the RF sputtering technique. The first kind film was composed a mixture and CdTeO3 crystallites obtained from thermal annealing amorphous oxygenated sputtered films. second one constituted low oxygen doped deposited at substrate temperature 500°C. characterized means X-ray diffraction, optical absorption Auger electron spectroscopy. results show that fundamental edge is shifted toward higher energy as consequence small size crystallites, which constitute them. versus crystallite radius relation analyzed in terms models Efros Kayanuma. Due to discrepancies experimental data with these models, numerical analysis made variational method implemented. This considers different environment surrounding two studied.