Extending the lifetime of optical lithography technologies with wavefront engineering

作者: Marc D. Levenson

DOI: 10.1143/JJAP.33.6765

关键词:

摘要: Various types of phase shifting mask, off-axis illumination, optical proximity correction and other innovations promise to extend the lifetime i-line (365 nm) deep ultra-violet (DUV) lithography technologies into subhalf-micron era. No single innovation seems likely produce a patterning paradigm that lasts more than one generation, but engineering solutions using combinations new options familiar may make technology viable well next century.

参考文章(2)
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