Effect of A-site Excess on the Piezoelectric Properties of (K0.48 Na0.52)1+x(Nb0.55Ta0.45)O3 Thin Films
作者： J. S. Park , D. Do , M. H. Lee , D. J. Kim , M.-H. Kim
DOI: 10.1080/00150193.2014.893808
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摘要: Lead-free polycrystalline (K0.48Na0.52)1+x(Nb0.55Ta0.45)O3 (x = 0, 0.01, 0.02 and 0.03) thin films have been grown on Pt(111)/Ti/SiO2/Si substrates using KrF excimer laser ablation to investigate the effects of A-site ion excess. The film at x 0.01 exhibited good ferroelectric hysteresis loop with a remnant polarization 2Pr 30 μC/cm2 coercive field 2Ec 61 kV/cm. piezoelectric coefficient d33,f KNNT was found amount 79 pm/V. These improved properties were attributed excess Na K ions.
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