Patterning method and method of forming memory device

作者: Jen-Hsiang Tsai

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摘要: A method of forming memory device is provided. substrate having at least two cell areas and one peripheral area between the target layer, a sacrificed layer first mask patterns in second are sequentially formed on substrate. Sacrificed partially removed to form by using as mask. Spacers sidewalls patterns. The spacers removed. areas. Target removed, remaining mask, word lines select gates portion adjacent area.

参考文章(19)
Kailash Gopalakrishnan, Rohit Sudhir Shenoy, Method of forming multi-high-density memory devices and architectures ,(2010)
Masaaki Higashitani, Takashi Orimoto, Vinod Robert Purayath, James K. Kai, Henry Chien, George Matamis, Integrated Nanostructure-Based Non-Volatile Memory Fabrication ,(2010)
Kyle A. Armstrong, Stephen W. Russell, Methods of forming features of integrated circuitry ,(2010)
Russell Nielsen, Eric Freeman, Zengtao “Tony” Liu, Luan C. Tran, John Lee, Integrated circuit fabrication ,(2006)
Sung Mun Jung, Jum Soo Kim, Method of fabricating flash memory device ,(2004)
William T. Rericha, Gurtej S. Sandhu, Jingyi Bai, Shuang Meng, Zhiping Yin, Puneet Sharma, D. Mark Durcan, Mirzafer K. Abatchev, Ramakanth Alapati, John Lee, Paul Morgan, Luan Tran, Sheron Honarkhah, Pitch reduced patterns relative to photolithography features ,(2007)