Effect of piezoelectric field on type II transition in InAlAs/InP (311) alloys with different substrate polarity

作者: B. Smiri , I. Fraj , F. Saidi , R. Mghaieth , H. Maaref

DOI: 10.1016/J.JALLCOM.2017.11.121

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摘要: Abstract A ternary Indium-Aliminium-Arsenic (InAlAs) is grown, by metal organic chemical vapor deposition (MOCVD), on a substrate InP (311) with polarity and B, doped Fer (Fe) atomic. Their optical properties have been studied photoluminescence spectroscopy (PL) in the whole temperature range from 10 to 300 K. At low region, power dependent analysis of PL intensity reveals conventional law an exponent n close one, agreement type II nature emission. red shift transition has observed sample B. The temperature-dependent measurements exhibit abnormal behaviors such as S-shape PL-peak energy, inverted N-shape full width at half maximum (FWHM). These atypical are linked exciton localization phenomenon, which it more pronounced structure orientation. Room temperature-PL spectra covers both emissions 1.3 1.55 μm for B oriented substrates, respectively. Our results indicate that In0.513Al0.487As/InP A/B expected be advantageous their application telecommunication.

参考文章(21)
L. C. Poças, J. L. Duarte, I. F. L. Dias, E. Laureto, S. A. Lourenço, D. O. Toginho Filho, E. A. Meneses, I. Mazzaro, J. C. Harmand, Photoluminescence study of interfaces between heavily doped Al0.48In0.52As:Si layers and InP (Fe) substrates Journal of Applied Physics. ,vol. 91, pp. 8999- 9004 ,(2002) , 10.1063/1.1475370
Esmaeil Abdoli, Hamid Haratizadeh, Investigation of the localization effect in InGaNAs/GaAs SQWs using the LSE model Physica Status Solidi B-basic Solid State Physics. ,vol. 247, pp. 170- 175 ,(2010) , 10.1002/PSSB.200844364
K. G. Merkel, V. M. Bright, C. L. A. Cerny, F. L. Schuermeyer, J. S. Solomon, R. A. Kaspi, Beryllium ion implantation in GaAsSb epilayers on InP Journal of Applied Physics. ,vol. 79, pp. 699- 709 ,(1996) , 10.1063/1.360814
D. L. Smith, C. Mailhiot, Piezoelectric effects in strained-layer superlattices Journal of Applied Physics. ,vol. 63, pp. 2717- 2719 ,(1988) , 10.1063/1.340965
E. Laureto, I. F. L. Dias, J. L. Duarte, E. Di Mauro, H. Iwamoto, M. T. P. Freitas, S. A. Lourenço, D. O. Toginho Filho, J. C. Harmand, Investigation of optical properties of interfaces between heavily doped Al0.48In0.52As:Si and InP (Fe) substrates by photoreflectance analysis Journal of Applied Physics. ,vol. 85, pp. 4184- 4188 ,(1999) , 10.1063/1.370329
Y. Nemirovsky, STATISTICAL MODELING OF CHARGE COLLECTION IN SEMICONDUCTOR GAMMA-RAY SPECTROMETERS Journal of Applied Physics. ,vol. 85, pp. 8- 15 ,(1999) , 10.1063/1.369425
M. D. Teodoro, I. F. L. Dias, E. Laureto, J. L. Duarte, P. P. González-Borrero, S. A. Lourenço, I. Mazzaro, E. Marega, G. J. Salamo, Substrate orientation effect on potential fluctuations in multiquantum wells of GaAs∕AlGaAs Journal of Applied Physics. ,vol. 103, pp. 093508- ,(2008) , 10.1063/1.2913513
M.A. Fathimulla, T. Loughran, L. Stecker, E. Hempfling, M. Mattingly, O. Aina, Heterojunction InAlAs/InP MESFETs grown by OMVPE IEEE Electron Device Letters. ,vol. 9, pp. 223- 225 ,(1988) , 10.1109/55.697