作者: Zlatica Marinković , Giovanni Crupi , Alina Caddemi , Gustavo Avolio , Antonio Raffo
DOI: 10.1002/JNM.2011
关键词:
摘要: … are in the field of temperature-dependent linear and noise characterization techniques for solid-state devices, cryogenic measurements and modeling of FET's and HEMT's, noise …