Determination of the nature of principal scattering mechanism in well-annealed vacuum deposited thin films of the ternary thermoelectric material Bi2(Te0.8Se0.2)3

作者: V. Damodara Das , Ramesh Chandra Mallik

DOI: 10.1016/S0040-6090(02)00919-7

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摘要: Abstract Resistivity and thermopower measurements were performed on thin films of Bi2(Te0.8Se0.2)3 prepared by flash evaporation technique. Applying the Jain–Verma theory to experimental data Bi2(Te0.8Se0.2)3, scattering index parameter was evaluated. The value found lie between −0.3 −0.2. This indicates presence other mechanisms, in addition lattice scattering.

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