作者: V. Damodara Das , Ramesh Chandra Mallik
DOI: 10.1016/S0040-6090(02)00919-7
关键词:
摘要: Abstract Resistivity and thermopower measurements were performed on thin films of Bi2(Te0.8Se0.2)3 prepared by flash evaporation technique. Applying the Jain–Verma theory to experimental data Bi2(Te0.8Se0.2)3, scattering index parameter was evaluated. The value found lie between −0.3 −0.2. This indicates presence other mechanisms, in addition lattice scattering.