Crystal morphology and nucleation in thin films of amorphous Te alloys used for phase change recording
作者： J. A. Kalb , C. Y. Wen , Frans Spaepen , H. Dieker , M. Wuttig
DOI: 10.1063/1.2034655
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摘要: … Ag 0.055 In 0.065 Sb 0.59 Te 0.29 thin films used for phase change recording. Tilting of plan view samples revealed that each crystallized growth formation is a bent single crystal. Cross…
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