Preparation and characterization of electrochemically etched W tips for STM
作者： Inger Ekvall , Erik Wahlström , Dan Claesson , Håkan Olin , Eva Olsson
DOI: 10.1088/0957-0233/10/1/006
关键词:
摘要: We have investigated methods for cleaning dc-etched polycrystalline tungsten tips scanning tunnelling microscopy (STM). The include Ar-ion sputtering, heating, chemical treatments and Ne-ion self-sputtering. correlate transmission electron images of the tip, field-emission data from tip a clean Cu(111) surface to find an optimum procedure STM imaging. Clean sharp are made by combined with careful heating bombardment. found that sputtering was obtained either use 4 keV gun few seconds or self-sputtering Ne ions until decapitation occurs.
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