The improvement of the accuracy of electromagnetic actuator based atomic force microscope operating in contact mode and the development of a new methodology for the estimation of control parameters and the achievement of superior image quality

摘要: Abstract The dynamics of atomic force microscope (AFM) acting in contact mode is crucial for correct interpretation AFM images and especially the identification artefacts determination their sources. This paper presents a methodology improvement image quality. developed dynamic model has been applied control scanning parameters to achieve superior provides possibility tune parameters, such as tip-surface interaction speed respect sample’s material cantilever’s tip geometry. allows us ensure ideal imaging conditions, evaluate produce picture Using this model, we can also analyze experimental data simulate results.