作者: Byung-hwan Chu , Byung Doo Chin , Kwang Hyeon Baik , Stephen J. Pearton , Fan Ren
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摘要: The effect of cryogenic temperature deposition Al and LiF contacts on the electrical optical performance organic light emitting diodes (OLEDs) was investigated. reverse current OLED with 77 K deposited reduced by one order magnitude, output intensity dramatically improved compared to device conventional e-beam evaporated cathodes, due damage metal film interface. Atomic force microscope (AFM) imaging showed uniformly distributed smaller grains, X-ray diffraction (XRD) pattern indicated better crystallinity for film. Also, an abrupt interface between contact polymer observed from secondary ion mass spectroscopy (SIMS) depth profiling.