Temperature dependent piezoreflectance study of Mo1−xWxSe2 layered crystals
作者： T. Y. Ke , H. P. Hsu , Y. P. Wang , Y. S. Huang
DOI: 10.1063/1.4936621
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摘要: The temperature dependence of the spectral features in vicinity direct band edge extonic transitions Mo1−xWxSe2 layered crystals were measured range 25–295 K using a piezoreflectance (PzR) technique. transition energies determined from detailed line-shape fit PzR spectra. characterization has shown tunable continuously tuned with W composition. parameters that describe variation and broadening function excitonic are evaluated discussed.
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