Formation of the Co/Si(110) interface: Phase composition and magnetic properties

作者: M. V. Gomoyunova , G. S. Grebenyuk , K. M. Popov , I. I. Pronin

DOI: 10.1134/S1063784213060145

关键词:

摘要: The formation of the Co/Si(110)16 × 2 interface and its magnetic properties are studied by high-energy-resolution photoelectron spectroscopy using synchrotron radiation linear dichroism in photoemission core electrons. It is shown that a cobalt coating less than 7 A thick deposited on silicon surface at room temperature results an ultrathin (1.7 A) interfacial silicide layer silicon-cobalt solid solution. ferromagnetic ordering observed evaporation dose corresponding to 6–7 which case metal film begins grow solution layer. During 300°C-annealing sample covered nanometer-thick layer, gradually disappears four phases arise: metastable Co3Si three stable nonmagnetic silicides (Co2Si, CoSi, CoSi2).

参考文章(30)
J.S. Pan, R.S. Liu, Z. Zhang, S.W. Poon, W.J. Ong, E.S. Tok, Co growth on Si(0 0 1) and Si(1 1 1) surfaces: Interfacial interaction and growth dynamics Surface Science. ,vol. 600, pp. 1308- 1318 ,(2006) , 10.1016/J.SUSC.2006.01.029
H. W. Chang, J. S. Tsay, Y. C. Hung, F. T. Yuan, W. Y. Chan, W. B. Su, C. S. Chang, Y. D. Yao, Magnetic properties and microstructure of ultrathin Co∕Si(111) films Journal of Applied Physics. ,vol. 101, ,(2007) , 10.1063/1.2712532
C. W. T. Bulle‐Lieuwma, A. H. van Ommen, J. Hornstra, C. N. A. M. Aussems, Observation and analysis of epitaxial growth of CoSi2 on (100) Si Journal of Applied Physics. ,vol. 71, pp. 2211- 2224 ,(1992) , 10.1063/1.351119
P. Castrucci, R. Gunnella, R. Bernardini, P. Falcioni, M. De Crescenzi, Magnetic force microscopy study of perpendicular magnetization reorientation for Fe grown on Cu/Si(111) Physical Review B. ,vol. 65, pp. 235435- 235439 ,(2002) , 10.1103/PHYSREVB.65.235435
J. S. Tsay, T. Y. Fu, M. H. Lin, C. S. Yang, Y. D. Yao, Microscopic interfacial structures and magnetic properties of ultrathin Co∕Si(111) films Applied Physics Letters. ,vol. 88, pp. 102506- ,(2006) , 10.1063/1.2185259
H. von Känel, C. Schwarz, S. Goncalves-Conto, E. Müller, L. Miglio, F. Tavazza, G. Malegori, New epitaxially stabilized CoSi phase with the CsCl structure. Physical Review Letters. ,vol. 74, pp. 1163- 1166 ,(1995) , 10.1103/PHYSREVLETT.74.1163
N. D. Kim, Y. K. Kim, C.-Y. Park, H. W. Yeom, H. Koh, E. Rotenberg, J. R. Ahn, High-resolution photoemission spectroscopy study of the single-domain Si ( 110 ) − 16 × 2 surface Physical Review B. ,vol. 75, pp. 125309- ,(2007) , 10.1103/PHYSREVB.75.125309
J. S. Tsay, C. S. Yang, Y. Liou, Y. D. Yao, Magnetic properties of ultrathin Co films on Si(111) and CoSi2 surfaces Journal of Applied Physics. ,vol. 85, pp. 4967- 4969 ,(1999) , 10.1063/1.370060